9031.49.70

For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices

Heading

9031

Subheading

Tariff line

1 immediate child · 1 terminal code

Children of 9031.49.70

10-digit statistical reporting numbers

9031.49.7000
Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: Other optical instruments and appliances: Other: For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices
Terminal code

Showing 1 immediate children