Current U.S. tariff record
HTS code
9031.41.0020
General duty
See source schedule
Description
HTS classification
Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: Other optical instruments and appliances: For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) For inspecting photomasks or reticles used in manufacturing semiconductor devices
- Ad valorem rate
- See source schedule
- Specific rates
- None listed
Within 9031.41.00
Other codes under this parent
- 9031.41.0020
Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: Other optical instruments and appliances: For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) For inspecting photomasks or reticles used in manufacturing semiconductor devices
- 9031.41.0040
Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: Other optical instruments and appliances: For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) For inspecting semiconductor wafers or devices: For wafers
- 9031.41.0060
Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: Other optical instruments and appliances: For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) For inspecting semiconductor wafers or devices: Other
Tariff record
Version history
2 versions, newest first
View this code on USITC(opens in a new tab)| Listed from | Listed to | General duty | Release |
|---|---|---|---|
| Jan 26, 2022Current | Current | See source schedule | 2022 HTSA Basic EditionJan 26, 2022 |
| Nov 18, 2019 | Jan 26, 2022 | See source schedule | 2019 HTSA Revision 17Nov 18, 2019 |